Retained austenite in steel Quantitative determination Method of X-ray diffractometer GB/T8362-1987钢中残余奥氏体定量测定X射线衍射仪法
Single crystal X-ray diffractometer 单晶体x射线衍射仪
The lattice constant determination of metals& Method of X-ray diffractometer GB/T8360-1987金属点阵常数的测定方法X射线衍射仪法
The phase and microhardness distributions in ceramic coating formed by microplasma oxidation on LY12 aluminum alloy were investigated using X-ray diffractometer and microhardness tester. 使用X射线衍射仪和显微硬度计测定了LY12铝合金微等离子体氧化陶瓷膜沿深度方向的相分布及显微硬度变化曲线。
Study on Effect of Fill-sample Depth on Determination with Polycrystal Powder X-ray Diffractometer 填样深度对多晶粉末X射线衍射仪测试结果的影响研究
Study on Application of X-ray Diffractometer in Identification of Chicken-blood Stone X射线衍射法在鸡血石鉴定中的应用
With the utilization of the X-ray diffractometer and scanning electron microscope in the iron oxide scale on the surface of the steel sheet. 利用X射线衍射仪与扫描电镜对薄板表面氧化铁皮进行观察分析,以探讨其形貌、微区成分、物相结构及含量对氧化铁皮与基体结合力的影响。
The true diffraction width of diffraction line was measured by using X-Ray Diffractometer, and it can be attained to determinate ultramicro particle size and lattice strain. 化效应.利用X射线衍射仪对衍射峰的纯衍射宽度定量测定,可对超微粒子的粒径大小和晶格微应变的程度作定量地分析。
The phase assemblages, elemental distribution and phase chemical composition were analyzed by using X-ray diffractometer ( XRD), scanning electron microscopy with energy dispersive spectrometer ( SEM/ EDS) and transmission electron microscopy with energy dispersive spectrometer ( TEM/ EDS). 采用了X射线衍射(XRD)、扫描电镜/能谱分析(SEM/EDS)和透射电镜/能谱分析(TEM/EDS)研究了矿相组合、元素分布和矿相化学组成等。
Devices and equipments such as optical microscope, metallographic microscope, scanning electron microscope ( SEM), X-ray diffractometer, microhardness tester, wear tester and so on, were used to observe the structure of boride layer and test properties of boride layer. 用光学显微镜、金相显微镜、扫描电镜(SEM)、X射线衍射仪、显微硬度计、磨损试验机等仪器和设备来观察渗层的组织和测试渗层的性能。
The copolymer was confirmed by means of Infrared spectroscopy, Microscope and X-ray diffractometer. 利用红外光谱、显微镜和X-射线衍射等手段对产物进行了结构和性能表征。
The phase structure was presented by X-ray diffractometer. 利用X射线衍射确定了粉体的组成;
Process parameters have been varied and the resulting films have been studied by X-ray diffractometer ( XRD), spectrophotometer and ohmmeter. 使用XRD对制备的薄膜进行了结构分析,测量了薄膜的吸收光谱和电阻,并研究了薄膜工艺条件的改变对薄膜结构和性能的影响。
Its component is analysed by means of Scanning Electron Microscope, X-ray Diffractometer, X-ray Energy Spectrometer. 它的组分是用扫描电子显微镜,X射线衍射仪和X射线能谱仪进行分析。
The product was analyzed by using X-ray diffractometer and electronic microscope and the dispersity in organic solvents was determined. 对产品进行了X-射线衍射和电镜分析,并检测了在有机溶剂中的分散性。
The Principle of X-ray diffractometer method of macrostress measurement is described in this Paper. 本文叙述了使用X射线衍射仪法测量宏观应力的原理。
Finally, the principle and method fo-r determing strain using X-ray diffractometer have been described. 最后介绍了采用X光衍射仪测定应变的原理和方法。
The authors have analysised the layers phase structure and texture phenomena loy X-ray diffractometer. 本又对该镀层的相结构及其织构现象进行了X光衍射分析。
By using optical metallography; TEM and x-ray diffractometer, microstructure and texture of 3004 aluminium alloy sheet from cast rolling plate are studied. 通过光学金相、透射电镜和x射线衍射技术等分析方法,研究了3004铝合金铸轧板的组织和织构特征。
Laser surface alloying treatment was applied to the Nb-plated depleted uranium and the phase structure and distribution of Nb in the treated surface layer were analyzed by x-ray diffractometer and energy density spectrometry. 应用激光技术对铀上铌镀层进行表面合金化处理,并应用能谱和X射线衍射仪对处理层中的铌元素分布和相结构进行了分析。
X-ray diffractometer ( XRD) was applied to analyze the texture of those Ag films. 通过XRD分析了银薄膜的择优取向(或织构)。
Both the macro-stress and micro-stress of the piezoelectric ZnO thin film are measured using X-ray diffractometer technique. 用X射线衍射仪法对压电ZnO薄膜的宏观内应力和微观内应力进行了测量。
The composition, structure, size distribution and particle polymer of the power samples were characterized by the means of TG ( Thermogravimetry), XRD ( X-ray diffractometer) and LPSA ( laser particles size analyzer). 用TG(热重)、XRD(粉末X-射线衍射)和LPSA(激光粒度仪)对粉末样品的组成、结构、粒度分布和粒子的团聚进行了表征。
The diffraction patterns of them are measured by X-ray diffractometer ( XRD) and microcosmic crystal-structure is analyzed. 用X射线衍射仪(XRD)测定了它们的衍射图样,对微观晶体结构进行了分析。
Phase structure analysis and metallographic structure observation were made by X-ray diffractometer and optical and electron microscope respectively. 用X射线衍射仪进行了物相分析;用金相显微镜和电子显微镜观察了合金组织。
The materials and wear debris were analysed by X-ray diffractometer. 借助X射线衍射仪分析了材料结构,用布氏硬度计测试了材料硬度。
We can "see" atom and molecule by single crystal X-ray diffractometer 单晶X射线衍射仪可以让我们看见原子和分子
Scanning electron microscope, X-ray diffractometer and optical microscope were used to analyze the microstructure of coatings. 测试性能比较后,利用扫描电镜、XRD和金相显微镜等来分析其微观组织和性能的关系。
We characterize the samples with X-ray diffractometer, scanning electron microscopes and EDS, and study the ultraviolet absorption of the samples with ultraviolet spectrometer. 并用x射线衍射仪、扫描电镜和能谱仪对样品进行了表征,用紫外分光光度计研究了样品的紫外吸收性能。